【Electrical Analysis】
8” Prober StationThis technology is used to identify the electrical characteristics, and probes ( ≤4 Probers) are connected to circuits of an IC, and connection with measurement instrument for inputting signals or conducting electrical measurements. 
|
|
I-V CurveThe IV electric characteristics measurement employs an auto curve tracing device to calculate resistance values, identify relations among circuits, detect Open/Short/Leak/High resistance circuit errors in real time 
|
|
IROMThe main principle of Infrared microscope using Infrared light wave to through silicon substrate then inspection device active area image comparison good sample and failure sample difference. 
|
|
AFMThe AFM is to cause a micro displacement of the cantilever using the atomic forces between the probe tip and the sample, to map the topography of the sample. AFM is applicable to various material surface topography. 
|
|