IC Operating Life Test

There are also test procedure and conditions corresponding to different product categories, such as HTGB (High Temperature Gate Bias) / HTRG (High Temperature Reverse Bias) / BLT (Bias Life Test) / IOL (Intermittent Operation Life).

During the test, it is necessary to add a power source (signal source) to facilitate the IC to enter the working state or steady state, and interact with the Acceleration Factor such as voltage, temperature and time to achieve the material aging effect.

Test condition

HTOL - High Temperature Operating Life Test

The high temperature and voltage used to accelerate the stress to evaluate the long life time of the IC. The dynamic signal have be used during test to meet the actual product running status.

ELFR - Early Life Failure Rate

To Used high temperature and voltage stress to screen early products to evaluate the early rate of products.

Reference Specification

JJESD 22-A108