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SUSTAINABILITY

永續共好,
綠色智造
Sustainable Growth, Green Manufacturing

以綠色製程、再生能源與資源循環,為半導體產業的永續未來盡一份心力。Through green processes, renewable energy and resource circularity, we contribute to a sustainable future for the semiconductor industry.

一站式服務,
高效能智造!!
One-Stop Solutions, Smarter Manufacturing, Greater Efficiency

台星科提供晶圓凸塊、晶粒處理、覆晶接合、晶圓與成品測試,以及可靠度驗證與失效分析,支援 200mm 與 300mm 晶圓。 Winstek provides wafer bumping, die preparation, flip chip assembly, wafer sort and final test, plus reliability assurance and failure analysis, supporting both 200mm and 300mm wafers.

  • 2000年成立Founded 2000
  • 櫃買代號 3265TPEx 3265
  • 芎林・竹科雙廠Two plants in Hsinchu

服務項目 Our Services

Bumping

  • Large Die Size Bump (50mm x 50mm)
  • fcBump (μBump, Mix bump height)
  • WLCSP
  • SiPh Bump
  • IPD/IVR
  • BSM
查看 Bumping 詳情View Bumping details

DPS

  • High Topography Wafer Grinding/Dicing
  • 200mm/300mm SiC, QST, GaN Dicing
  • Stack Die Grinding/Dicing
  • Plasma Dicing
  • Stealth Dicing
查看 DPS 詳情View DPS details

Assembly

  • FCBGA (CPU/GPU/AI Server)
  • 60 x 60 mm above, warpage control
  • FCCSP (SSD/DRAM)
  • Hybrid
查看 Assembly 詳情View Assembly details

TEST

  • Wafer Sort (AI pad inspection)
  • Final Test (Tri-Temp + ATC 2/3Kw)
  • SLT (Tri-Temp + ATC 2/3Kw)
  • ORT/ORM Test
查看 TEST 詳情View TEST details

Laboratory RA/FA

  • Robustness Test
  • Operating Life Test
  • Package Reliability
  • Board-Level Reliability
  • FIB (Wafer Level) / SAT / SEM
查看 Laboratory RA/FA 詳情View Laboratory RA/FA details

終端應用對焦,為您的產業量身打造 Focused Support for Your Industry

AI / HPC

高效能運算封裝方案High-Performance Computing

大尺寸 FCBGA(60×60mm 以上)翹曲控制、2.5D/Hybrid Bonding 整合、高功率 Tri-Temp 測試,滿足 AI 加速器與伺服器級晶片的散熱與訊號完整性挑戰。 Large-body FCBGA (60×60mm+) warpage control, 2.5D/hybrid bonding integration, and high-power Tri-Temp testing for AI accelerators and server-class silicon.

車用電子Automotive

高可靠度驗證方案High-Reliability Qualification

IATF 16949 製程管控、Operating Life Test/Board-Level Reliability、ORT/ORM 長期監控,符合車規可靠度要求與長生命週期供應保證。 IATF 16949 process controls, Operating Life Test / Board-Level Reliability, and ORT/ORM monitoring for automotive-grade reliability.

IoT

低功耗物聯網整合方案Low-Power IoT Integration

WLCSP/SiP 小型化封裝、多晶片異質整合,兼顧成本效益與長期供貨穩定性,滿足終端裝置量產需求。 WLCSP/SiP miniaturized packaging and multi-die heterogeneous integration, balancing cost efficiency with long-term supply stability for volume production.

國際認證與品質背書International Certifications
查看認證詳情View Certifications

值得信賴的長期技術夥伴A Trusted Long-Term Technology Partner

與我們的業務團隊討論您的封裝與測試需求。Talk with our sales team about your assembly and test requirements.

業務信箱Salessales@winstek.com.tw
電話Phone+886-3-593-6565
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